nan c681d51fd1 Refactor depth-related tests and improve parameter handling in image cutout symmetry

2026-09-17 00:12:57 +08:00

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specs/mask-cut-depth-sampling

Refactor depth-related tests and improve parameter handling in image cutout symmetry

2026-09-17 00:12:57 +08:00

.openspec.yaml

Refactor depth surface handling and unify depth sampling rules

2026-09-16 16:30:56 +08:00

design.md

Refactor depth-related tests and improve parameter handling in image cutout symmetry

2026-09-17 00:12:57 +08:00

proposal.md

Refactor depth-related tests and improve parameter handling in image cutout symmetry

2026-09-17 00:12:57 +08:00

tasks.md

Refactor depth-related tests and improve parameter handling in image cutout symmetry

2026-09-17 00:12:57 +08:00