Files
AnyImage/openspec/changes/simplify-depth-group-options/specs/depth-node-options/spec.md
nan 7f69630371 Refactor depth node groups and simplify options
- Removed `Smooth Weight` input from `O Image Depth Plane`, `O Image Depth Cutout`, and `O Image Depth Panorama` to streamline the interface and maintain consistent boundary smoothing behavior.
- Adjusted the `Reference Depth` input to appear last in the options panel for better organization, reflecting its role as a calibration value.
- Consolidated the `expand_smooth()` function to only accept necessary parameters, eliminating unused branches related to `Smooth Weight` and `pin_sharp`.
- Updated related tests and node assets to ensure functionality remains intact and consistent with the new structure.
- Introduced new specifications to document the changes and ensure compliance with the updated requirements.
2026-09-16 13:12:12 +08:00

1.9 KiB

ADDED Requirements

Requirement: 深度节点组不公开 Smooth Weight

O Image Depth Plane、O Image Depth Cutout、O Image Depth Panorama SHALL 不在公开接口中提供 Smooth Weight,边界平滑 MUST 按完整影响场混合顶点位置。

Scenario: 检查节点组接口

  • WHEN 读取三个节点组的输入接口
  • THEN 接口不存在 Smooth Weight,且 Boundary Smooth 仍控制边界平滑迭代次数

Scenario: 默认边界平滑结果

  • WHEN 用户保持默认参数并提高 Boundary Smooth
  • THEN 边界带内的顶点按影响场强度移动到平滑位置,影响带外的顶点保持不变

Requirement: 共享平滑构建只保留影响场形态

expand_smooth() SHALL 只接受迭代次数输入、影响场与几何,并 MUST 在迭代次数为零时原样返回输入几何。

Scenario: 迭代次数为零

  • WHEN Boundary Smooth 为 0
  • THEN 输出几何与输入几何完全一致

Requirement: Options 中的 Reference Depth 位于最后

包含 Reference Depth 的节点组 SHALL 在 Options 面板最后一项提供该输入,其余 Options 控制项 MUST 保持各自职责与默认值。

Scenario: 检查 Depth Plane 与 Depth Cutout 排列

  • WHEN 读取 O Image Depth Plane 与 O Image Depth Cutout 的 Options 项顺序
  • THEN 最后一项为 Reference Depth,之前的项依次为各自的艺术调整参数

Scenario: 检查 Relief Plane 排列

  • WHEN 读取 O Image Relief Plane 的 Options 项顺序
  • THEN 项顺序为 Mask Threshold、Reference Depth

Requirement: Reference Depth 保持既有几何含义

移动面板位置 SHALL 不改变 Reference Depth 的类型、子类型、默认值、范围与几何运算方式。

Scenario: 校验输入属性

  • WHEN 读取 Reference Depth 输入
  • THEN 该输入使用 DISTANCE 子类型,并继续作为采样深度的运算基准